Electrical Engineering PhD students Bohyun Kang and Sangwook Lee and master’s student Hyunseo Yoo (advisor: Professor Rock-Hyun Baek) each won a Best Student Paper Award at the 7th IEEE Electron Devices Technology and Manufacturing Conference.

The international conference discusses semiconductor manufacturing technologies, equipment, and device performance improvements. Approximately 800 people from 25 countries attended, with 375 papers presented.

In Process, Tools, Yield, and Manufacturing, Kang fabricated an MFMIS gate stack demonstrating excellent memory performance and presented development of an etching process for the MFMIS structure. The work earned a Best Student Award.

In Modeling and Simulation, Lee proposed a process that suppresses nanosheet transistor performance degradation caused by fabrication variations and substantially improves performance without additional processing. The work earned a Best Student Award.

In Reliability, Yoo developed and presented a body-effect solution to overcome performance degradation and limitations in transistors operating at cryogenic temperatures for quantum computing applications, earning a Best Student Award.