Sang-boo Yoon, an integrated master's/Ph.D. student in POSTECH's Department of Electrical Engineering advised by Professor Young-joo Lee, received the Best Design Award at the IDEC Congress Chip Design Contest.

IDEC supports system semiconductor design infrastructure at Korean universities and holds the country's largest CDC during its annual Congress.

More than 70 designs were entered at the 2024 Congress at KAIST on July 9. Yoon's “High-throughput and scalable deep learning driven massive MIMO detector in 28nm CMOS technology” received the highest evaluation.

The design implemented the world's first deep-learning-based massive MIMO detector and proposed optimizations that substantially improve throughput and power efficiency while providing better algorithmic performance than previous work.